China 'GB/T 42907-2023 ' standard english version:

NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA

GB/T 42907-2023

Testing of non-equilibrium carrier recombination lifetime in silicon ingots, silicon blocks and silicon wafers Non-contact eddy current induction method
硅锭、硅块和硅片中非平衡载流子复合寿命的测试非接触涡流感应法

Issued Date:2023/8/6

Implemented Date:2024/3/1

Issued by:

The Standardization Administration of the People's Republic of China

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GB Standard Code	GB/T 42907-2023
Standard Category	China National Standards
GB Standard English Title	Testing of non-equilibrium carrier recombination lifetime in silicon ingots, silicon blocks and silicon wafers Non-contact eddy current induction method{译}
GB Standard Chinese Title	硅锭、硅块和硅片中非平衡载流子复合寿命的测试非接触涡流感应法
Chinese Version Price	$5.00 per page
English Translation Fee	$15.00~$30.00 per 1 page
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China 'GB/T 42907-2023 ' standard english version:

GB/T 42907-2023

Testing of non-equilibrium carrier recombination lifetime in silicon ingots, silicon blocks and silicon wafers Non-contact eddy current induction method硅锭、硅块和硅片中非平衡载流子复合寿命的测试 非接触涡流感应法

Testing of non-equilibrium carrier recombination lifetime in silicon ingots, silicon blocks and silicon wafers Non-contact eddy current induction method
硅锭、硅块和硅片中非平衡载流子复合寿命的测试非接触涡流感应法